Thursday October 02 , 2014

ImageMEMS probes

A probe card is an interface between an electronic test system and a semiconductor wafer. MEMS type is the most advanced technology currently available.

ImageDouble-ended Pins

CCP gives our customer various choices of IC testing pins with different dimensions and coating materials. We provide instant service and reasonable price.

ImageIC Socket

In performing the test, a jig is required to insert and fix the semiconductor IC package.

ImageBoard Connector

Board to board Connectors are available in a choice of row types and can be selected by the customer to best suit their application.

ImageCable/docking Connector

A dock Connector is a Connector used to attach a mobile electronic device simultaneously to multiple external resources.

ImageAK Series

ImageHign-Current Solution

Following the booming industry in the electric motor industry, CCP has also dedicate its effort in probe testing for electric vehicle and has receive positive feedback from the customer.

Search:
Unit:mm
PartName
(料號)
TotalLength
(總長)
WorkingHeight
(工作高度)
Spring(g)
(彈力)
BarrelLength
(管長)
Length
(管身長)
PlungerDiameter
(針頭外徑)
BarrelDiameter
(管身外徑)
BottomDiameter
(底座外徑)
Taillength
(尾PIN)
Type
(類型)
PDF
H199M2 2.30 2.18 30 1.50 1.2 0.80 1.25 1.4 F
H199M0 2.10 1.50 100 1.45 1.25 0.80 1.25 1.4 F
H192M1 2.60 2.00 100 1.60 1.05 0.90 1.47 1.62 F
H186M0 9.00 7.80 100 6.30 5.3 1.00 1.51 1.8 F
H184M0 10.20 8.70 90 7.50 7.5 1.00 1.51 2 3.60 P
H181M3 6.50 5.70 100 5.50 3.9 0.90 1.51 2 0.80 P
H181M2 7.50 6.70 100 6.00 5.2 0.90 1.51 2 0.80 P
H181M1 10.50 9.50 90-150 8.80 7.8 1.00 1.51 1.8 1.00 P
H181M0 6.76 5.85 110 5.40 4.6 1.00 1.51 2.7 0.80 P
H180M5 15.20 13.20 100 15.00 10.6 0.90 1.49 2 3.30 P
H180M1 11.50 9.60 35-55 8.50 8.5 1.00 1.48 1.51 10.70 P
H180M0 11.10 9.60 35-55 8.50 8.5 1.00 1.51 2 10.70 P
H179M0 6.30 5.20 110 4.50 3.9 1.00 1.51 2 F
H173M0 3.50 3.00 50 2.30 1.9 0.80 1.32 1.5 F
H168M0 4.50 3.70 100 2.90 2.5 1.00 1.51 1.8 F
H166M0 4.00 2.85 110 2.50 2.5 1.00 1.48 1.8 2.50 P
H165M0 7.35 6.45 95 5.65 5.05 0.90 1.48 1.53 F
H164M0 6.00 4.50 110 3.80 3.8 2.30 3.00 3.5 1.60 P
H160M2 4.15 3.35 130 2.95 2.95 0.80 2.00 1.6 S
H160M1 4.60 3.75 130 3.30 3.3 0.80 2.50 1.2 S

IC Socket

ImageIC Socket

In performing the test, a jig is required to insert and fix the semiconductor IC package.

Double-ended Pins

ImageDouble-ended Pins

CCP gives our customer various choices of IC testing pins with different dimensions and coating materials. We provide instant service and reasonable price.

MEMS probes

ImageMEMS probes

A probe card is an interface between an electronic test system and a semiconductor wafer. MEMS type is the most advanced technology currently available.